A Volterra mapping-based S-parameter behavioral model for nonlinear RF and microwave circuits and systems

Author

Tianhai Wang ; Brazil, T.J.

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland

Volume

2

fYear

1999

fDate

13-19 June 1999

Firstpage

783

Abstract

This paper presents a Volterra mapping-based S-parameter equivalent model for nonlinear RF/microwave circuits and systems. In this S-parameter-oriented approach to behavioral modelling, the linear part and the nonlinear parts are independent and have their own physical definitions. It is straightforward to obtain estimates of linear and nonlinear distortion by using the model parameters, as well as obtaining predictions of the behaviour of nonlinear networks.

Keywords

S-parameters; UHF circuits; Volterra series; electric distortion; microwave circuits; nonlinear distortion; nonlinear network analysis; S-parameter behavioral model; Volterra mapping-based model; equivalent model; linear distortion; nonlinear RF circuits; nonlinear RF microwave circuits; nonlinear RF systems; nonlinear distortion; nonlinear microwave systems; Circuits and systems; Educational institutions; Frequency domain analysis; Impedance matching; Microwave circuits; Nonlinear distortion; Radio frequency; Reflection; Scattering parameters; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1999 IEEE MTT-S International

Conference_Location

Anaheim, CA, USA

Print_ISBN

0-7803-5135-5

Type

conf

DOI

10.1109/MWSYM.1999.779876

Filename

779876