Title :
Characterisation Of Gridded Field Emitters
Author :
Huang, M. ; Mackenzie, R.A.D. ; Godfrey, T.J. ; Smith, G.D.W.
Author_Institution :
University of Oxford
Keywords :
Atomic measurements; Chemical analysis; Current measurement; Detectors; Electron emission; Electron sources; Field emitter arrays; Microscopy; Probes; Surface structures;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700254