Title :
Prototyping and testing of analog integrated circuits
Author_Institution :
Austriamicrosystems, Unterpremstaetten, Austria
Abstract :
The author describes various procedures to minimize risks involved in prototyping of analogue and mixed signal integrated circuits at external fabs and compares different approaches of minimizing NRE costs. Additionally the author describes multi product wafer (MPW) or multi layer mask (MLM) service and procedures of parallel processing of different design versions on one mask set. Furthermore he gives some guidelines for efficient production ramp-up and yield optimization and opens a discussion on the optimization on back-end assembly and test activities. Finally several online tools provided by foundries from the engineering phase through production will be discussed.
Keywords :
analogue integrated circuits; mixed analogue-digital integrated circuits; analog integrated circuit; mixed signal integrated circuit; multilayer mask service; multiproduct wafer service; Analog integrated circuits; Circuit testing; Costs; Guidelines; Integrated circuit testing; Mixed analog digital integrated circuits; Parallel processing; Process design; Production; Prototypes;
Conference_Titel :
Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-4952-1
Electronic_ISBN :
978-1-4244-4952-1
DOI :
10.1109/ASQED.2009.5206277
