Title :
Instruction selection using binate covering for code size optimization
Author :
Liao, S. ; Devadas, S. ; Keutzer, K. ; Tjiang, S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
We address the problem of instruction selection in code generation for embedded DSP microprocessors. Such processors have highly irregular data-paths, and conventional code generation methods typically result in inefficient code. Instruction selection can be formulated as directed acyclic graph (DAG) covering. Conventional methods for instruction selection use heuristics that break up the DAG into a forest of trees and then cover them independently. This breakup can result in suboptimal solutions for the original DAG. Alternatively, the DAG covering problem can be formulated as a binate covering problem, and solved exactly or heuristically using branch-and-bound methods. We show that optimal instruction selection on a PAG in the case of accumulator-based architectures requires a partial scheduling of nodes in the DAG, and we augment the binate covering formulation to minimize spills and reloads. We show how the irregular data transfer costs of typical DSP data-paths can be modeled in the binate covering formulation.
Keywords :
computer aided software engineering; digital signal processing chips; directed graphs; microprogramming; real-time systems; accumulator-based architectures; binate covering; branch-and-bound methods; code size optimization; directed acyclic graph covering; embedded DSP microprocessors; highly irregular data-paths; instruction selection; irregular data transfer costs; partial node scheduling; reloads; spills; Application specific integrated circuits; Costs; Digital integrated circuits; Digital signal processing; Embedded system; Microcontrollers; Microprocessors; Processor scheduling; Read only memory; Tree graphs;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.480146