• DocumentCode
    2997119
  • Title

    Efficient Reconfiguration Algorithm for Three-dimensional VLSI Arrays

  • Author

    Jiang, Guiyuan ; Jigang, Wu ; Sun, Jizhou

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Tianjin Univ., Tianjin, China
  • fYear
    2012
  • fDate
    21-25 May 2012
  • Firstpage
    261
  • Lastpage
    265
  • Abstract
    Reconfigurable VLSI array is a well known fault tolerant architecture for parallel computing, but few reconfiguration approaches are reported so far for three-dimensional (3D) arrays due to the high complexity of reconfiguration. This paper is devoted to develop reconfiguration algorithm for three-dimensional degradable VLSI arrays. Three bypass schemes and three rerouting schemes are proposed to reconfigure a 3D host array with faults resulting in a target sub-array without faults. Moreover, a heuristic algorithm based on plane rerouting is proposed to construct a target sub-array on the selected rows and columns. It is also proved that the reconfiguration problem considered in this paper on the selected rows and columns(MPSRC) can be optimally solvable in linear time. Empirical study shows that the proposed algorithm produces target arrays with good harvest for the case of the fault rate no more than 5%, that is often occurred in real applications.
  • Keywords
    VLSI; logic circuits; network routing; parallel processing; three-dimensional integrated circuits; 3D VLSI arrays; MLA; MPSRC; bypass schemes; efficient reconfiguration algorithm; fault tolerant architecture; heuristic algorithm; maximal logical array; parallel computing; plane rerouting; reconfigurable VLSI array; rerouting schemes; three-dimensional degradable VLSI arrays; Degradation; Fault tolerance; Fault tolerant systems; Ground penetrating radar; Indexes; Logic arrays; Very large scale integration; 3D VLSI array; algorithm; fault tolerance; reconfigurable;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-0974-5
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2012.29
  • Filename
    6270648