DocumentCode :
2997139
Title :
Multilevel interconnect planarization by voltage and laser programmable links using ion implantation
Author :
Herndon, T.O. ; Burns, J.A. ; Chapman, G.H. ; Raffel, J.I.
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
fYear :
1989
fDate :
12-13 Jun 1989
Firstpage :
322
Lastpage :
328
Abstract :
A technique is described whereby implantation of silicon through a mask into the intermetal insulator modifies the insulation. After deposition and definition of the upper metal, the implanted regions between metal levels act as voltage programmable links. Application of a voltage between upper and lower metal electrodes causes the implanted insulation to become conductive, producing a low-resistance, planar, vertical connection. Alternatively, these implanted areas can be rendered conducting by exposure to a focused laser beam
Keywords :
VLSI; ion implantation; laser beam applications; metallisation; Si ion implantation; VLSI; conductive implanted insulation layer; interconnect planarization; intermetal insulator; laser programmable links; multilevel interconnection; via programmable links; voltage programmable links; Contacts; Dielectrics and electrical insulation; Electric breakdown; Etching; Implants; Integrated circuit interconnections; Ion implantation; Planarization; Silicon compounds; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Multilevel Interconnection Conference, 1989. Proceedings., Sixth International IEEE
Conference_Location :
Santa Clara, CA
Type :
conf
DOI :
10.1109/VMIC.1989.77991
Filename :
77991
Link To Document :
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