• DocumentCode
    2997183
  • Title

    Simulation of voltage and electric-field distribution for contaminated glass insulator

  • Author

    Othman, N.A. ; Piah, M.A.M. ; Adzis, Z. ; Ahmad, Harith ; Ahmad, N.A.

  • Author_Institution
    Inst. of High Voltage & High Current, Univ. Teknol. Malaysia, Skudai, Malaysia
  • fYear
    2013
  • fDate
    16-17 Dec. 2013
  • Firstpage
    116
  • Lastpage
    120
  • Abstract
    Overhead transmission line insulators are designed to perform dual functions namely electrical protection and mechanical support. However, irregular distribution of voltage and electric-field in the insulators may lead to corona, partial discharge, premature aging and indeed flashover. An attempt has been made with finite element software to calculate the voltage and electric-field distribution in this paper. QuickField™ Professional software is adopted to simulate the distribution of voltage and electric-field along the insulator surface with and without the presence of contaminants. Glass insulator, particularly cap and pin insulator is taken as main research object. The result shows that the contaminated insulator distorts the distribution of voltage and electric-field significantly. Therefore, vital to study both voltage and electric field distribution as it is valuable for designing insulator as well as to predict the performance of the insulator under contaminated conditions.
  • Keywords
    corona; finite element analysis; glass; insulator contamination; partial discharges; power overhead lines; QuickField Professional software; contaminated glass insulator; corona; electric-field distribution; electrical protection; finite element software; indeed flashover; mechanical support; overhead transmission line insulators; partial discharge; premature aging; voltage distribution; Electric fields; Finite element analysis; Glass; Insulators; Software; Surface contamination; electric field distribution; finite element software; glass insulator; voltage distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research and Development (SCOReD), 2013 IEEE Student Conference on
  • Conference_Location
    Putrajaya
  • Type

    conf

  • DOI
    10.1109/SCOReD.2013.7002554
  • Filename
    7002554