Title :
Study of an Automated Precise SEU Fault Injection Technique
Author :
Jing, Zhou ; Zengrong, Liu ; Lei, Chen ; Shuo, Wang ; Zhiping, Wen ; Lishuai, Wu ; Xun, Chen
Author_Institution :
FPGA Dept., Beijing Microelectron. Technol. Inst., Beijing, China
Abstract :
SRAM-based FPGAs are susceptible to SEUs. To emulate the effects of SEUs, a variety of fault injection techniques have been studied. As FPGA logic density continues to increase, injecting faults into full bit stream is very time consuming. To further study the SEU effects and the mitigation techniques, an advanced precise SEU fault injection technique is studied in this paper. With this technique, a novel system named automated precise fault injection system (APFIS) is made to inject faults into certain resource of the circuit, instead into the whole bit stream. In this paper, this system will be proved to be faster and more efficient by the success of injecting faults into two sets of designs. Using this system will encourage the utilization of FPGAs for space-based applications.
Keywords :
SRAM chips; fault diagnosis; field programmable gate arrays; radiation hardening (electronics); APFIS; FPGA logic density; SRAM-based FPGA; automated precise SEU fault injection technique; fault injection techniques; field programmable gate array; mitigation techniques; single event upsets; Circuit faults; Field programmable gate arrays; Flip-flops; Indexes; Random access memory; Single event upset; Table lookup; Field programmable gate array (FPGA); configuration addressing; fault injection; single event upset (SEU);
Conference_Titel :
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-0974-5
DOI :
10.1109/IPDPSW.2012.32
