The time recorder for the accelerated aging life testing of dielectric material under high square voltage

A life time recorder is advisably required in the ageing life testing of dielectric material , because parallel testing of multi-samples is allowed with less time costing and more exact result. Based on the thermal measurement to monitor and record the state of the dielectric samples, a recorder is presented in this paper. When some samples are broken-down,the rapid rising of temperature of the limiting resistors installed in the high voltage test circuit can be considered as the broken down signals of the samples. So those signals are transferred into digital signals first,then computed by microcomputer and last output control signals.The exact life recording with time percentage error less than 2% and quick cutting within 1-3 seconds of the broken-down channel can be both achieved by this way. The life time recorder presented in this paper has been put into practical application and work well.