• DocumentCode
    2997344
  • Title

    MEMS vs. IC manufacturing: Is integration between processes possible

  • Author

    Vemal, R. ; Lo, Calvin ; Ong, Sherrill ; Lee, B.S. ; Yong, C.C.

  • Author_Institution
    Packaging Solutions Dev., Freescale Semicond. (M) Sdn Bhd, Petaling Jaya, Malaysia
  • fYear
    2009
  • fDate
    15-16 July 2009
  • Firstpage
    39
  • Lastpage
    43
  • Abstract
    Microelectromechanical systems (MEMS) remain one of the fastest growing markets in the semiconductor technology industry. This growth is largely due to the increasing possibility of integration into various applications. These include the automotive industry, process control and automation, scientific and medical instrumentation, telecommunication, commodity products and environmental monitoring. Much of the process technology for MEMS in terms of wafer and package level manufacturing has been sought from the rather established IC (Integrated Circuit) industry. In some cases, the processes and application of materials have been a direct replicate of existing practices. However, the question remains to what extent can we apply the IC replication process for MEMS while taking into consideration the much more delicate nature of MEMS parts for reliability´s sake. There needs to be a thorough analysis on these differences to determine if a new standard of manufacturing is needed. If this point is neglected for the sake of cost saving in manufacturing operations, there is a high possibility the integrity of the MEMS parts will suffer with subsequent downstream processing. This literature work aims to provide a much deeper and in-depth understanding in this area from a packaging point-of-view. We will revisit the various processes and fundamental differences between MEMS and IC packaging.
  • Keywords
    integrated circuit manufacture; integrated circuit packaging; micromechanical devices; reliability; semiconductor industry; IC packaging; IC replication process; MEMS; integrated circuit industry; microelectromechanical systems; reliability; semiconductor technology industry; Automotive engineering; Communication industry; Electrical equipment industry; Industrial control; Integrated circuit packaging; Manufacturing industries; Manufacturing processes; Microelectromechanical systems; Micromechanical devices; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4952-1
  • Electronic_ISBN
    978-1-4244-4952-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2009.5206300
  • Filename
    5206300