DocumentCode :
2997362
Title :
Using Run-Time Reconfiguration to Implement Fault-Tolerant Coarse Grained Reconfigurable Architectures
Author :
Schweizer, Thomas ; Küster, Anja ; Eisenhardt, Sven ; Kuhn, Tommy ; Rosenstiel, Wolfgang
Author_Institution :
Comput. Eng., Eberhard Karls Univ. Tubingen, Tübingen, Germany
fYear :
2012
fDate :
21-25 May 2012
Firstpage :
320
Lastpage :
327
Abstract :
Triple modular redundancy (TMR) is a common method to implement fault-tolerant circuits. Traditionally, TMR is realized by triplication of components. In order to reduce the area overhead of TMR another approach was proposed on coarse grained reconfigurable architectures (CGRAs). In that approach spare functional units (FUs) are used for redundant computation of results. However, it was not shown that this approach is workable for any application. In this work we close that gap. We mapped several multipoint fast Fourier transform on a CGRA of different array sizes and analyzed the ratio of spare FUs to used FUs. If the number of spare FUs is not sufficient to find a fault-tolerant application mapping, we propose to use run-time reconfiguration to extend the number of spare FUs in the time domain. We compared this strategy with the traditional approach in terms of area and throughput. The comparing results show that run-time reconfiguration can be a suitable method for decreasing the area overhead of TMR, however at the expense of lower throughput.
Keywords :
fast Fourier transforms; fault tolerant computing; reconfigurable architectures; CGRA; FU; TMR; fast Fourier transform; fault-tolerant application mapping; fault-tolerant circuits; fault-tolerant coarse grained reconfigurable architectures; run-time reconfiguration; spare functional units; triple modular redundancy; Clocks; Context; Delay; Fault tolerant systems; Redundancy; Tunneling magnetoresistance; TMR; coarse-grained; reconfiguration; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium Workshops & PhD Forum (IPDPSW), 2012 IEEE 26th International
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-0974-5
Type :
conf
DOI :
10.1109/IPDPSW.2012.39
Filename :
6270658
Link To Document :
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