Title :
Extraction of transient behavioral model of digital I/O buffers from IBIS
Author :
Tehrani, Peivand F. ; Chen, Yuzhe ; Fang, Jiayuan
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Binghamton, NY, USA
Abstract :
A method for extraction and simulation of transient behavioral models of state transition of digital I/O buffers is introduced. This scheme increases the speed of chip interconnect simulations with large number of simultaneous switching devices, while maintaining good accuracy compared to corresponding transistor level models. This paper covers the derivation procedures of such transient state transition behavioral models from IBIS modeling data. A comparison of simulation results between these models and transistor level models (SPICE models) is also included
Keywords :
transient analysis; IBIS; SPICE models; chip interconnect simulations; digital I/O buffers; simultaneous switching devices; state transition; transient behavioral model; transistor level models; Analytical models; Circuit simulation; Crosstalk; Data mining; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Power system transients; Transient analysis; Voltage;
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3286-5
DOI :
10.1109/ECTC.1996.550806
