DocumentCode
2997619
Title
Extraction of transient behavioral model of digital I/O buffers from IBIS
Author
Tehrani, Peivand F. ; Chen, Yuzhe ; Fang, Jiayuan
Author_Institution
Dept. of Electr. Eng., State Univ. of New York, Binghamton, NY, USA
fYear
1996
fDate
28-31 May 1996
Firstpage
1009
Lastpage
1015
Abstract
A method for extraction and simulation of transient behavioral models of state transition of digital I/O buffers is introduced. This scheme increases the speed of chip interconnect simulations with large number of simultaneous switching devices, while maintaining good accuracy compared to corresponding transistor level models. This paper covers the derivation procedures of such transient state transition behavioral models from IBIS modeling data. A comparison of simulation results between these models and transistor level models (SPICE models) is also included
Keywords
transient analysis; IBIS; SPICE models; chip interconnect simulations; digital I/O buffers; simultaneous switching devices; state transition; transient behavioral model; transistor level models; Analytical models; Circuit simulation; Crosstalk; Data mining; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Power system transients; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-3286-5
Type
conf
DOI
10.1109/ECTC.1996.550806
Filename
550806
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