• DocumentCode
    2997710
  • Title

    Timing optimization with testability considerations

  • Author

    Saldanha, A. ; Brayton, R.K. ; Sangiovanni-Vincentelli, A.L. ; Cheng, K.-T.

  • Author_Institution
    California Univ., Berkeley, CA, USA
  • fYear
    1990
  • fDate
    11-15 Nov. 1990
  • Firstpage
    460
  • Lastpage
    463
  • Abstract
    Since redundancy is undesirable in high performance circuits, the authors explore timing optimization procedures to determine whether performance optimization may be achieved without introducing redundancy. They demonstrate the conditions under which timing optimization may introduce single stuck-fault redundancies into a given irredundant circuit and illustrate the difficulties in removing or preventing these redundancies. The authors then resolve the question of whether a testability criterion exists that may be retained or easily maintained as invariant during timing resynthesis.<>
  • Keywords
    logic design; logic testing; redundancy; high performance circuits; irredundant circuit; redundancy; testability considerations; timing optimization; timing resynthesis; Circuit faults; Circuit testing; Delay; Integrated circuit testing; Logic testing; Optimization; Redundancy; Robustness; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-2055-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1990.129953
  • Filename
    129953