Title :
Efficient automatic diagnosis of digital circuits
Author :
Liaw Heh-Tyan ; Tsaih Jia-Horng ; Lin Chen-Shang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
The problem of automatic diagnosis of digital circuits with efficiency is studied. Two improvements over the method of J.C. Madre et al. (1989) are developed to enhance the efficiency of diagnosis. Specifically, the dominance relation in circuit topology is utilized to reduce the search space of possibly correctable gates. In the authors´ experiment, the search space is reduced to about one-half. A novel divide-and-conquer technique to determine the correct gate function is proposed.<>
Keywords :
fault location; logic testing; network topology; automatic diagnosis; circuit topology; correctable gates; digital circuits; divide-and-conquer technique; dominance relation; search space; Circuit synthesis; Circuit topology; Combinational circuits; Digital circuits; Equations; Error correction; Sequential circuits;
Conference_Titel :
Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Papers., 1990 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2055-2
DOI :
10.1109/ICCAD.1990.129954
