• DocumentCode
    2997976
  • Title

    Evaluation of pavement cracking performance in the state of rhode island using falling weight deflectometer data

  • Author

    Jha, Vivek ; Mehta, Yusuf ; Byrne, Michael ; Manning, Francis ; Saridaki, Edward J.

  • Author_Institution
    Dept. of Civil & Environ. Eng., Rowan Univ., Glassboro, NJ
  • fYear
    2009
  • fDate
    17-19 Feb. 2009
  • Firstpage
    90
  • Lastpage
    94
  • Abstract
    The rehabilitation process usually undertaken by the Rhode Island Department of Transportation (RIDOT) for preservation of cracked pavement involves milling and replacing 2.5-5 cm of the surface layer. The problem associated with the above process was that the pavement in Rhode Island still failed prematurely and thus caused RIDOT lose millions of dollars. The purpose of this study was to determine ways that the cracking can be controlled in the surface layer and provide the solution for this problem in the form of catalog from which various stiffness and thickness can be selected for the surface layer based on different field condition. The criteria that differentiated an uncracked section from cracked sections were found to be a limiting value of tensile critical strain beneath the surface layer. In most of the overlay sections it was observed that the thickness provided by the RIDOT was too thin and thus cracking was observed at those stations.
  • Keywords
    cracks; maintenance engineering; nondestructive testing; road building; roads; tensile strength; Rhode Island; falling weight deflectometer; nondestructive testing; pavement cracking performance; rehabilitation process; tensile critical strain; Costs; Data engineering; Milling; Nondestructive testing; Research and development; Road transportation; Surface cracks; Synthetic aperture sonar; Tensile strain; USA Councils; FWD; RIDOT; cracking; critical strain; non destructive testing; rehabilitation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors Applications Symposium, 2009. SAS 2009. IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-2786-4
  • Electronic_ISBN
    978-1-4244-2787-1
  • Type

    conf

  • DOI
    10.1109/SAS.2009.4801784
  • Filename
    4801784