DocumentCode :
2998340
Title :
Heating Effects In Electron Emission From Microtips At High Fields And Temperatures
Author :
Chung, M.S. ; Cutler, P.H. ; Miskovsky, N.M. ; Park, S.H.
Author_Institution :
The Pennsylvania State University
fYear :
1993
fDate :
12-15 Jul 1993
Firstpage :
40
Lastpage :
40
Keywords :
Circuit stability; Electron emission; Electron microscopy; Heating; Laboratories; Microelectronics; Temperature distribution; Thermal stability; Tunneling; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
Type :
conf
DOI :
10.1109/IVMC.1993.700261
Filename :
700261
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2998340
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