DocumentCode :
2999269
Title :
Thermal Field Ionization Electron Emission
Author :
Ptitsin, V.E.
Author_Institution :
Russian Academy of Sciences
fYear :
1993
fDate :
12-15 Jul 1993
Firstpage :
46
Lastpage :
47
Keywords :
Acceleration; Current-voltage characteristics; Dielectrics; Electron emission; Electron traps; Elementary particle vacuum; Instruments; Ionization; Linearity; Semiconductor diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
Type :
conf
DOI :
10.1109/IVMC.1993.700266
Filename :
700266
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2999269
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