Title :
Direct fault detection and analysis of GaAs IC´s chip on wafer
Author :
Tian, X.J. ; Zhang, D.M. ; Sun, W. ; Chen, K.X. ; Yang, H. ; Yi, M.B.
Author_Institution :
State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun, China
Abstract :
A practical electro-optic sampling system was introduced in this paper, its optical system construction can hold the stability with designed precision for a few years. The voltage sensitivity of unit detection bandwidth is 2.6 mV/√Hz. The fault detection and analysis for a GaAs dynamic divider chip have been made using double frequency electronic phase shift scanning
Keywords :
III-V semiconductors; digital integrated circuits; electro-optical devices; fault location; gallium arsenide; high-speed integrated circuits; integrated circuit testing; stability; GaAs; GaAs dynamic divider chip; GaAs high-speed ICs; direct fault analysis; direct fault detection; double frequency electronic phase shift scanning; electro-optic sampling system; optical system; stability; voltage sensitivity; Bandwidth; Fault detection; Frequency conversion; Gallium arsenide; Optical design; Optical frequency conversion; Optical sensors; Sampling methods; Stability; Voltage;
Conference_Titel :
Circuits and Systems, 2000. IEEE APCCAS 2000. The 2000 IEEE Asia-Pacific Conference on
Conference_Location :
Tianjin
Print_ISBN :
0-7803-6253-5
DOI :
10.1109/APCCAS.2000.913643
