• DocumentCode
    2999683
  • Title

    High-performance thermal interface technology overview

  • Author

    Linderman, R. ; Brunschwiler, T. ; Smith, B. ; Michel, B.

  • Author_Institution
    IBM Res. GmbH, Zurich
  • fYear
    2007
  • fDate
    17-19 Sept. 2007
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    An overview on recent developments in thermal interfaces is given with a focus on a novel thermal interface technology that allows the formation of 2-3 times thinner bondlines with strongly improved thermal properties at lower assembly pressures. This is achieved using nested hierarchical surface channels to control the particle stacking with highly particle-filled materials. Reliability testing with thermal cycling has also demonstrated a decrease in thermal resistance after extended times with longer overall lifetime compared to a flat interface.
  • Keywords
    integrated circuit testing; reliability; thermal resistance; chips power density; high-performance thermal interface technology; nested hierarchical surface channels; particle-filled materials; reliability testing; thermal cycling; Assembly; Bonding; Conducting materials; Electronic packaging thermal management; Immune system; Inorganic materials; Thermal conductivity; Thermal loading; Thermal resistance; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigation of ICs and Systems, 2007. THERMINIC 2007. 13th International Workshop on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-2-35500-002-7
  • Type

    conf

  • DOI
    10.1109/THERMINIC.2007.4451762
  • Filename
    4451762