Title :
Phantom redundancy: a high-level synthesis approach for manufacturability
Author :
Iyer, B. ; Karri, R. ; Koren, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
Phantom redundancy, an area-efficient technique for fabrication-time reconfigurability is presented. Phantom redundancy adds extra interconnect so as to render the resulting microarchitecture reconfigurable in the presence of any (single) functional unit failure. The proposed technique yields partially good chips in addition to perfect chips. A genetic algorithm is used to incorporate phantom redundancy constraints into microarchitecture synthesis. The algorithm minimizes tire performance degradation due to any faulty functional unit of the resulting microarchitecture. The effectiveness of the technique is illustrated on benchmark examples.
Keywords :
circuit CAD; high level synthesis; logic design; reconfigurable architectures; redundancy; fabrication-time reconfigurability; functional unit failure; genetic algorithm; high-level synthesis; manufacturability; microarchitecture; microarchitecture synthesis; phantom redundancy; Degradation; Fault tolerance; Hardware; High level synthesis; Imaging phantoms; Job shop scheduling; Manufacturing; Microarchitecture; Redundancy; Testing;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.480199