DocumentCode :
2999992
Title :
OPC-Aware Routing Reconstruction for OPE Reduction
Author :
Yan, Jin-Tai ; Lee, Chia-Fang
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsinchu
Volume :
2
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
366
Lastpage :
369
Abstract :
In this paper, given a set of routed nets on the routing grids, based on the concept of optical effects and the computation of OPE for any routing grid, any routed net can be reconstructed to reduce total OPE by using the reassignment of the Steiner points and the original routing path. Furthermore, by using the concept of the diffusion process for all the routed nets, all the routed nets can be reconstructed to avoid possible feature collision in post-layout OPC and reduce total OPE on the routing grids. The experimental results show that our proposed reconstruction approach reduces 22%~38% total OPE of all the routed nets on the routing grids for the tested examples.
Keywords :
design for manufacture; network routing; photolithography; proximity effect (lithography); OPC-aware routing reconstruction; Steiner points reassignment; design for manufacturability; diffusion process; manufacturing process; optical effects; optical lithography; optical proximity correction; optical proximity error reduction; post-layout OPC; routed nets reconstruction; routing grids; routing path; Computer science; Costs; Diffusion processes; Grid computing; Image reconstruction; Lagrangian functions; Manufacturing processes; Optical design; Routing; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382288
Filename :
4267366
Link To Document :
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