DocumentCode
3000513
Title
Event-Related Potentials induced by cuts in feature movies and their exploitation for understanding cut efficacy
Author
Matran-Fernandez, Ana ; Poli, Riccardo
Author_Institution
Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK
fYear
2015
fDate
22-24 April 2015
Firstpage
74
Lastpage
77
Abstract
In this paper, we analyse the Event-Related Potentials (ERPs) produced by cuts where the scenes before and after the cut are narratively related. In tests with 6 participants and 930 cuts from 5 Hollywood feature movies we found that cuts produce a large negative ERP with an onset 100 ms after a cut and a duration of 600 ms, distributed over a very large region of the scalp. The real-world nature of the stimuli makes it hard to characterise the effects of cuts on a trial-by-trial basis. However, we found that aggregating data across all electrodes and averaging the ERPs elicited by cuts across all participants (a technique we borrowed from collaborative brain-computer interfaces) produced more reliable information. In particular we were able to reveal a relationship between the length of shots and the amplitude of the corresponding ERP with longer scenes producing bigger amplitudes. We also found that amplitudes vary across and within movies, most likely as a consequence of movie directors and editors using different choices of cutting techniques. In the future, we will explore the possibility of turning these findings into a collaborative brain-computer interface for aiding test screening by evaluating whether specific cuts have their intended effect on viewers.
Keywords
bioelectric potentials; brain-computer interfaces; electroencephalography; medical signal processing; neurophysiology; Hollywood feature movies; collaborative brain-computer interface; cut efficacy; event-related potentials; Brain-computer interfaces; Collaboration; Correlation; Electrodes; Electroencephalography; Motion pictures; TV;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Engineering (NER), 2015 7th International IEEE/EMBS Conference on
Conference_Location
Montpellier
Type
conf
DOI
10.1109/NER.2015.7146563
Filename
7146563
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