Title :
Coercivity Reduction in Nickel Ferrite (NiFe
O
) Thin Films Through Surface Patterning
Author :
Rasic, Goran ; Schwartz, Justin
Author_Institution :
Dept. of Mater. Sci. & Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
NiFe2O4(NFO), a spinel ferrite with high electrical resistivity and favorable magnetic properties, is an interesting material for high-frequency signal and power electronic applications. Here, significant reduction in the coercivity of NFO films is obtained through surface patterning via nanoimprint lithography. Multilayered NFO films are grown on c-plane (0001) sapphire substrates using room temperature chemical solution deposition. Two film variants, layer-by-layer and bulk, are deposited. Prior to crystallization, films are patterned with a polydimethylsiloxane stamp. Good feature transfer to the thin-film surface is confirmed by atomic force microscopy and transmission electron microscopy. Θ-2Θ X-ray diffraction shows that both variants produce single-phase inverse spinel NFO, with better texture in the layer-by-layer samples. Magnetic measurements show substantial reduction in coercivity in the patterned samples due to the surface anisotropy-enhanced demagnetization field. The bulk patterned sample showed the lowest coercivity, ~18 Oe in-plane, albeit with reduced saturation magnetization, whereas the layer-by-layer patterned film maintained the same degree of texture and saturation as unpatterned films, with a ~80% reduction in coercivity. These results show that nanoimprint lithography of chemical solution deposition films is a cost-effective pathway to engineering the coercivity of NFO films while retaining desirable saturation magnetization and texture.
Keywords :
X-ray diffraction; atomic force microscopy; coercive force; crystallisation; demagnetisation; ferrites; liquid phase deposition; magnetic anisotropy; magnetic multilayers; magnetic thin films; nanolithography; nickel compounds; texture; transmission electron microscopy; Al2O3; NiFe2O4; X-ray diffraction; atomic force microscopy; bulk film; c-plane (0001) sapphire substrates; coercivity reduction; crystallization; electrical resistivity; high-frequency signal applications; layer-by-layer film; magnetic measurements; magnetic properties; multilayered films; nanoimprint lithography; nickel ferrite thin films; polydimethylsiloxane stamp; power electronic applications; room temperature chemical solution deposition; saturation magnetization; single-phase inverse spinel; spinel ferrite; surface anisotropy-enhanced demagnetization field; surface patterning; temperature 293 K to 298 K; texture; transmission electron microscopy; Coercive force; Ferrites; Magnetic hysteresis; Nanolithography; Saturation magnetization; Surface morphology; Surface treatment; Soft magnetic materials; ferromagnetic films; magnetic losses; nanostructured materials;
Journal_Title :
Magnetics Letters, IEEE
DOI :
10.1109/LMAG.2014.2302246