• DocumentCode
    3002123
  • Title

    Lithium battery analysis: Probability of failure assessment using logistic regression

  • Author

    Moebes, Travis A.

  • Author_Institution
    2450 NASA Parkway, #224D, Houston, TX 77058
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Fourteen hundred rows by 53 columns of vendor cell acceptance data were processed though logistic regression using Insightful Corporation´s Insightful Miner™ (IM) and SAS Institute Inc.´s SAS® Enterprise Miner (EM) to find any significant correlation between 52 test output parameters (independent variables) and the pass/fail outcome for each of the 1,400 battery cells tested. The goal was to find helpful predictors for detecting “good” or “bad” cells in the form of a best logistic regression model. Data from five cells selected by Johnson Space Center´s (JSC´s) Energy Systems Division (ESD) were processed through three model options (Option1, Option2, and Option3) to determine the best model and to indicate a known cell that failed. The output from the best model showed good acceptability statistics and indicated the failed cell was less acceptable than the other cells. The processing and model building results were similar in both IM and SAS EM. The model described by this paper may be applied to any vendor battery cells where acceptance data is available.
  • Keywords
    failure analysis; lithium; regression analysis; secondary cells; ESD; IM; Insightful Corporation; JSC; Johnson Space Center; Li; SAS EM; SAS Institute Inc; battery cells; energy systems division; enterprise miner; failure assessment probability; insightful miner; lithium battery analysis; logistic regression model; test output parameters; vendor cell acceptance data; Analytical models; Batteries; Data models; Electrostatic discharge; Logistics; Synthetic aperture sonar; Testing; data mining; logistic regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754424
  • Filename
    5754424