DocumentCode
3002123
Title
Lithium battery analysis: Probability of failure assessment using logistic regression
Author
Moebes, Travis A.
Author_Institution
2450 NASA Parkway, #224D, Houston, TX 77058
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
5
Abstract
Fourteen hundred rows by 53 columns of vendor cell acceptance data were processed though logistic regression using Insightful Corporation´s Insightful Miner™ (IM) and SAS Institute Inc.´s SAS® Enterprise Miner (EM) to find any significant correlation between 52 test output parameters (independent variables) and the pass/fail outcome for each of the 1,400 battery cells tested. The goal was to find helpful predictors for detecting “good” or “bad” cells in the form of a best logistic regression model. Data from five cells selected by Johnson Space Center´s (JSC´s) Energy Systems Division (ESD) were processed through three model options (Option1, Option2, and Option3) to determine the best model and to indicate a known cell that failed. The output from the best model showed good acceptability statistics and indicated the failed cell was less acceptable than the other cells. The processing and model building results were similar in both IM and SAS EM. The model described by this paper may be applied to any vendor battery cells where acceptance data is available.
Keywords
failure analysis; lithium; regression analysis; secondary cells; ESD; IM; Insightful Corporation; JSC; Johnson Space Center; Li; SAS EM; SAS Institute Inc; battery cells; energy systems division; enterprise miner; failure assessment probability; insightful miner; lithium battery analysis; logistic regression model; test output parameters; vendor cell acceptance data; Analytical models; Batteries; Data models; Electrostatic discharge; Logistics; Synthetic aperture sonar; Testing; data mining; logistic regression;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754424
Filename
5754424
Link To Document