• DocumentCode
    3002212
  • Title

    Development of an applied-magnetic-field diode for ion-beam-transport experiments

  • Author

    Young, Frederic ; Neri, J.M. ; Boller, J.R. ; Hinshelwood, D.D. ; Jones, T.G. ; Oliver, Bryan V. ; Ottinger, P.F. ; Stephanakis, S.J. ; Fisher, R.C. ; Greenly, J.B.

  • Author_Institution
    Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
  • fYear
    1996
  • fDate
    3-5 June 1996
  • Firstpage
    194
  • Abstract
    Summary form only given. An applied-magnetic-field ion diode (ABD) is being developed to study the transport of intense ion beams for light-ion inertial confinement fusion. Initially, the beam from this diode will be used to test the concept of self-pinched transport (SPT). The design goal is diode operation at 1.5 MV and 250-kA total current on the Gamble II generator at NRL. This goal is based on Gamble II experiments with a 50-cm/sup 2/ area ABD, and a grooved-anode flashover source which produced 55 kA at 1.25 MV and V/sub crit//V/spl ap/2.5. Also, a measured beam divergence of 25 mrad is used in this design. A diode with an anode area of 160 cm/sup 2/ is required. To match this diode to Gamble II, a parallel electron-beam load upstream of the ABD is used to clamp the voltage, producing a more monoenergetic beam with improved focusing. For SPT experiments, the beam is extracted from the diode and focused into a transport channel. The ATHETA code (Sandia National Laboratories) is used to calculate B-field configurations in the diode and ion-beam trajectories.
  • Keywords
    ion beams; 1.4 cm; 1.5 MV; 250 kA; 65 cm; ATHETA code; B-field configurations; Gamble II generator; applied-magnetic-field diode; applied-magnetic-field ion diode; design goal; grooved-anode flashover source; intense ion beams; ion-beam trajectories; ion-beam-transport experiments; light-ion inertial confinement fusion; parallel electron-beam load; self-pinched transport; Anodes; Automatic testing; Clamps; Diodes; Flashover; Fusion power generation; Inertial confinement; Ion beams; Laboratories; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3322-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1996.550841
  • Filename
    550841