• DocumentCode
    3002493
  • Title

    Design of reliability demonstration testing for repairable systems

  • Author

    Guo, Huairui ; Liao, Haitao ; Gerokostopoulos, Athanasios ; Mettas, Adamantios

  • Author_Institution
    Theor. Dev., ReliaSoft Corp., Tucson, AZ, USA
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Reliability Demonstration Testing (RDT) for non-repairable systems has been successfully implemented in many industries, such as microelectronics, aerospace and healthcare. In designing RDTs, the famous beta-binomial formula is often applied to determine the necessary sample size so that the required reliability metric at a given confidence level can be demonstrated. However, many systems, such as cars and combine harvesters, are repairable systems. For repairable systems, RDT design methods have been developed mainly for Homogeneous Poisson Processes (HPP). This paper provides a new RDT design method applicable for both HPP and Non-Homogeneous Poisson Process (NHPP) cases. The result shows that the proposed method can effectively determine the required testing time and sample size of test units to demonstrate the required Mean Time Between Failures (MTBF). A comparison study is also conducted to illustrate the superior performance of the proposed method over some of the existing methods.
  • Keywords
    reliability; stochastic processes; homogeneous Poisson processes; mean time between failures; nonhomogeneous poisson process; reliability demonstration testing; repairable systems; Design methodology; Equations; Mathematical model; Reliability engineering; Testing; Upper bound; Fisher information matrix; Reliability demonstration testing; repairable systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754441
  • Filename
    5754441