• DocumentCode
    3002514
  • Title

    Effective EFSM generation for HW/SW-design verification

  • Author

    Bertasi, Michele ; Di Guglielmo, Giuseppe ; Fummi, Franco ; Pravadelli, Graziano

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
  • fYear
    2010
  • fDate
    4-6 Oct. 2010
  • Firstpage
    209
  • Lastpage
    212
  • Abstract
    The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.
  • Keywords
    automatic test pattern generation; finite state machines; ATPG; EFSM generation; HW/SW-design verification; extended finite state machine; state space; Automatic test pattern generation; Complexity theory; Control systems; Registers; Silicon; Timing; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Conference (BEC), 2010 12th Biennial Baltic
  • Conference_Location
    Tallinn
  • ISSN
    1736-3705
  • Print_ISBN
    978-1-4244-7356-4
  • Electronic_ISBN
    1736-3705
  • Type

    conf

  • DOI
    10.1109/BEC.2010.5631006
  • Filename
    5631006