DocumentCode
3002514
Title
Effective EFSM generation for HW/SW-design verification
Author
Bertasi, Michele ; Di Guglielmo, Giuseppe ; Fummi, Franco ; Pravadelli, Graziano
Author_Institution
Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
fYear
2010
fDate
4-6 Oct. 2010
Firstpage
209
Lastpage
212
Abstract
The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.
Keywords
automatic test pattern generation; finite state machines; ATPG; EFSM generation; HW/SW-design verification; extended finite state machine; state space; Automatic test pattern generation; Complexity theory; Control systems; Registers; Silicon; Timing; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2010 12th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4244-7356-4
Electronic_ISBN
1736-3705
Type
conf
DOI
10.1109/BEC.2010.5631006
Filename
5631006
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