DocumentCode
3002770
Title
Availability growth modeling and assessment
Author
Bluvband, Zigmund ; Porotsky, Sergey
Author_Institution
A.L.D. Ltd., Tel-Aviv, Israel
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
5
Abstract
The reliability growth process, applied to a complex system under development, involves surfacing failure modes, analyzing the modes and their causes, and implementing corrective actions (fixes) to detected problems. In such a manner, the system reliability is grows and its configuration is going to be mature with respect to reliability. The conventional procedure of the Reliability growth implies evaluation of two principal parameters of the Non-Homogeneous Poison Process (NHPP) related to the failure rate only. In addition to the Reliability aspect, the Availability factor, and, as the result, the Availability growth (not only Reliability growth) is extremely important for the repairable Systems. Yet because the standard NHPP does not take into account the repair rate parameters, the practitioners are awaiting for a long time for an expanded procedure for the Availability Growth tracking. This paper suggests a model and a numerical method to evaluate these parameters, establishing consequently the Inherent Availability Growth model, i.e. considering only corrective maintenance times due to failures. The model can be further generalized for Operational and Achieved Availability by taking in account the preventive maintenance, administrative and logistics times as appropriate.
Keywords
large-scale systems; maintenance engineering; reliability theory; stochastic processes; availability growth assessment; availability growth modeling; availability growth tracking; complex system; logistics times; nonhomogeneous poison process; reliability growth process; repairable systems; Availability; Entropy; Maintenance engineering; Maximum likelihood estimation; Optimization; Availability Growth; Global Optimization; NHPP; Reliability Growth; cross-entropy; parameter estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754456
Filename
5754456
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