DocumentCode
3002904
Title
Software reliability accelerated testing method based on test coverage
Author
Wang, Shuanqi ; Wu, Yumei ; Lu, Minyan ; Li, Haifeng
Author_Institution
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear
2011
fDate
24-27 Jan. 2011
Firstpage
1
Lastpage
7
Abstract
In order to increase the effectiveness and efficiency of software reliability testing, an accelerated testing method based on test coverage is presented in this paper. The amount of reliability test cases is reduced by a heuristic test-suite reduction algorithm based on static analysis of test coverage. The testing process is accelerated by the strategy of not executing redundant test cases and compensating their execution time. The corresponding software reliability accelerated testing (SRAT) process is proposed. Also a novel two-dimensional NHPP software reliability growth model (SRGM) depending on testing time and test coverage simultaneously is developed to describe software reliability growth phenomenon in the SRAT process. The estimation method of its parameters is discussed. Finally the verification work using a case study has also been done and is introduced. Some conventional SRGMs including GO, MO and Yamada_Ohba_Osaki models are used as comparisons. Results of the experiment demonstrate clearly that the accelerated method can accelerate the reliability testing process dramatically and the proposed model is able to conduct feasible and accurate reliability assessment. Their feasibility and effectiveness are verified.
Keywords
parameter estimation; program diagnostics; program testing; software reliability; heuristic test-suite reduction algorithm; parameter estimation method; software reliability accelerated testing method; static analysis; test coverage; two-dimensional NHPP software reliability growth model; Life estimation; Mathematical model; Software; Software algorithms; Software reliability; Testing; software reliability accelerated testing; software reliability model; test coverage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
Conference_Location
Lake Buena Vista, FL
ISSN
0149-144X
Print_ISBN
978-1-4244-8857-5
Type
conf
DOI
10.1109/RAMS.2011.5754463
Filename
5754463
Link To Document