• DocumentCode
    3002904
  • Title

    Software reliability accelerated testing method based on test coverage

  • Author

    Wang, Shuanqi ; Wu, Yumei ; Lu, Minyan ; Li, Haifeng

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In order to increase the effectiveness and efficiency of software reliability testing, an accelerated testing method based on test coverage is presented in this paper. The amount of reliability test cases is reduced by a heuristic test-suite reduction algorithm based on static analysis of test coverage. The testing process is accelerated by the strategy of not executing redundant test cases and compensating their execution time. The corresponding software reliability accelerated testing (SRAT) process is proposed. Also a novel two-dimensional NHPP software reliability growth model (SRGM) depending on testing time and test coverage simultaneously is developed to describe software reliability growth phenomenon in the SRAT process. The estimation method of its parameters is discussed. Finally the verification work using a case study has also been done and is introduced. Some conventional SRGMs including GO, MO and Yamada_Ohba_Osaki models are used as comparisons. Results of the experiment demonstrate clearly that the accelerated method can accelerate the reliability testing process dramatically and the proposed model is able to conduct feasible and accurate reliability assessment. Their feasibility and effectiveness are verified.
  • Keywords
    parameter estimation; program diagnostics; program testing; software reliability; heuristic test-suite reduction algorithm; parameter estimation method; software reliability accelerated testing method; static analysis; test coverage; two-dimensional NHPP software reliability growth model; Life estimation; Mathematical model; Software; Software algorithms; Software reliability; Testing; software reliability accelerated testing; software reliability model; test coverage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754463
  • Filename
    5754463