Split post dielectric resonator technique for precise measurements of laminar dielectric specimens-measurement uncertainties

Author

Krupka, J. ; Clarke, R.N. ; Rochard, C. ; Gregory, A.P.

Author_Institution

Inst. of Microelectron. & Optoelectron., Tech. Univ. Warsaw, Poland

Volume

1

fYear

2000

fDate

2000

Firstpage

305

Abstract

A split-post dielectric resonator was used to measure solid laminar dielectric specimens which had been previously measured by a number of other techniques. Detailed error analysis of permittivity and dielectric loss tangent measurements has been performed. It was proved that, by using a 4 GHz split post resonator, it is possible to measure permittivity with uncertainties down to 0.3% and dielectric loss tangent with resolution 2×10^-5 for well machined laminar specimens

Keywords

dielectric loss measurement; dielectric materials; dielectric resonators; error analysis; measurement errors; microwave measurement; permittivity measurement; 3.9 GHz; dielectric loss tangent measurements; error analysis; laminar dielectric specimens; permittivity measurements; split post dielectric resonator technique; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Error analysis; Loss measurement; Measurement uncertainty; Performance evaluation; Permittivity measurement; Solids;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar and Wireless Communications. 2000. MIKON-2000. 13th International Conference on

Conference_Location

Wroclaw

Print_ISBN

83-906662-3-5

Type

conf

DOI

10.1109/MIKON.2000.913930

Filename

913930