• DocumentCode
    3003089
  • Title

    Power-delay efficient technology mapping of BDD-based circuits using DCVSPG cells

  • Author

    Paul, Gay ; Reddy, Raghu ; Ghosh, Joydeb ; Pal, Arnab ; Mandal, C.R. ; Bhattacharya, Bhargab B.

  • Author_Institution
    Dept. of CSE, Indian Inst. of Technol., Kharagpur
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    123
  • Lastpage
    128
  • Abstract
    Efficient technology mapping has become an important vehicle in deep-submicron technologies for improving performance-oriented synthesis. On the other hand, library-based Pass Transistor Logic (PTL) synthesis, like Lean Integration with Pass-Transistors (LEAP) synthesis, has drawn significant attention to the VLSI research community. In this paper, we propose three new library cells based on differential cascode voltage Switch with Pass Gate Logic (DCVSPG). Synthesis using these cells outperforms the existing LEAP-based synthesis for BDD-based (Binary Decision Diagram-Based) circuits. Results on benchmark circuits show that the new cell-based mapping technique yields more than 60% reduction in both power and delay in the synthesized circuits.
  • Keywords
    binary decision diagrams; logic circuits; logic design; network synthesis; transistor circuits; BDD-based circuits; DCVSPG cells; VLSI; binary decision diagram-based circuits; deep-submicron technologies; differential cascode voltage switch; lean integration with pass-transistors synthesis; library-based pass transistor logic synthesis; pass gate logic; performance-oriented synthesis; power-delay efficient technology; synthesized circuits; technology mapping; Boolean functions; Circuit synthesis; Data structures; Delay; Libraries; Logic gates; Switches; Vehicles; Very large scale integration; Voltage; BDD; DCVSPG; LEAP; Logic synthesis; Low power; PTL; Technology mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop, 2008. IDT 2008. 3rd International
  • Conference_Location
    Monastir
  • Print_ISBN
    978-1-4244-3479-4
  • Electronic_ISBN
    978-1-4244-3478-7
  • Type

    conf

  • DOI
    10.1109/IDT.2008.4802481
  • Filename
    4802481