• DocumentCode
    3003252
  • Title

    How far can you get with a modern face recognition test set using only simple features?

  • Author

    Pinto, Nicolas ; DiCarlo, James J ; Cox, David D.

  • Author_Institution
    MIT, Cambridge, MA, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    2591
  • Lastpage
    2598
  • Abstract
    In recent years, large databases of natural images have become increasingly popular in the evaluation of face and object recognition algorithms. However, Pinto et al. previously illustrated an inherent danger in using such sets, showing that an extremely basic recognition system, built on a trivial feature set, was able to take advantage of low-level regularities in popular object and face recognition sets, performing on par with many state-of-the-art systems. Recently, several groups have raised the performance “bar” for these sets, using more advanced classification tools. However, it is difficult to know whether these improvements are due to progress towards solving the core computational problem, or are due to further improvements in the exploitation of low-level regularities. Here, we show that even modest optimization of the simple model introduced by Pinto et al. using modern multiple kernel learning (MKL) techniques once again yields “state-of-the-art” performance levels on a standard face recognition set (“labeled faces in the wild”). However, at the same time, even with the inclusion of MKL techniques, systems based on these simple features still fail on a synthetic face recognition test that includes more “realistic” view variation by design. These results underscore the importance of building test sets focussed on capturing the central computational challenges of real-world face recognition.
  • Keywords
    face recognition; feature extraction; learning (artificial intelligence); object recognition; MKL technique; face recognition test set; feature extraction; multiple kernel learning; natural image; object recognition algorithm; Buildings; Face recognition; Humans; Image databases; Kernel; Large-scale systems; Object recognition; Robustness; Spatial databases; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-3992-8
  • Type

    conf

  • DOI
    10.1109/CVPR.2009.5206605
  • Filename
    5206605