DocumentCode
3003252
Title
How far can you get with a modern face recognition test set using only simple features?
Author
Pinto, Nicolas ; DiCarlo, James J ; Cox, David D.
Author_Institution
MIT, Cambridge, MA, USA
fYear
2009
fDate
20-25 June 2009
Firstpage
2591
Lastpage
2598
Abstract
In recent years, large databases of natural images have become increasingly popular in the evaluation of face and object recognition algorithms. However, Pinto et al. previously illustrated an inherent danger in using such sets, showing that an extremely basic recognition system, built on a trivial feature set, was able to take advantage of low-level regularities in popular object and face recognition sets, performing on par with many state-of-the-art systems. Recently, several groups have raised the performance “bar” for these sets, using more advanced classification tools. However, it is difficult to know whether these improvements are due to progress towards solving the core computational problem, or are due to further improvements in the exploitation of low-level regularities. Here, we show that even modest optimization of the simple model introduced by Pinto et al. using modern multiple kernel learning (MKL) techniques once again yields “state-of-the-art” performance levels on a standard face recognition set (“labeled faces in the wild”). However, at the same time, even with the inclusion of MKL techniques, systems based on these simple features still fail on a synthetic face recognition test that includes more “realistic” view variation by design. These results underscore the importance of building test sets focussed on capturing the central computational challenges of real-world face recognition.
Keywords
face recognition; feature extraction; learning (artificial intelligence); object recognition; MKL technique; face recognition test set; feature extraction; multiple kernel learning; natural image; object recognition algorithm; Buildings; Face recognition; Humans; Image databases; Kernel; Large-scale systems; Object recognition; Robustness; Spatial databases; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206605
Filename
5206605
Link To Document