• DocumentCode
    3003338
  • Title

    Advanced models for software reliability prediction

  • Author

    Bluvband, Zigmund ; Porotsky, Sergey ; Talmor, Michael

  • Author_Institution
    A.L.D. Ltd., Tel-Aviv, Israel
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This article describes the advanced parametric models for assessment and prediction of software reliability, based on statistics of bugs at the initial stage of testing. The parametric model approach, commonly associated with reliability issues, deals with the evaluation of the amount of bugs in the code. Computed parameter values inserted into the model allow to estimate: (a) number of bugs remaining in the product, and (b) time required to detect the remaining bugs. Many models are developed for similar purpose: Duane Reliability Growth Model, Goel Model, Weibull Model, Classical S-shaped Model, Ohba S-shaped Model, etc. Taking into account some detailed, but practical, aspects of the software testing process, a few Advanced Models were developed and usefully implemented by the authors. The proposed models are sensitive to the situations typical for the early stages of Software development. As a result, one deals with the essentially non-linear, multimodal goal function to define the optimal value as the estimation of the unknown control parameter. To support the optimization of such complex models, the Cross-Entropy Global Optimization Method is proposed. Some authentic numerical examples are considered to demonstrate the efficiency of the proposed models.
  • Keywords
    optimisation; program debugging; program testing; reliability; software reliability; Goel Model; Weibull Model; cross-entropy global optimization method; duane reliability growth model; ohba s-shaped model; s-shaped model; software development; software reliability prediction; software testing process; Computer bugs; Maximum likelihood estimation; Optimization; Software; Software reliability; Testing; analytical models; cross-entropy; software reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754487
  • Filename
    5754487