Title :
Depth from sliding projections
Author :
Hermans, Chris ; Francken, Yannick ; Cuypers, Tom ; Bekaert, Philippe
Author_Institution :
Expertise Centre for Digital Media, Hasselt Univ., Hasselt, Belgium
Abstract :
In this paper we present a novel method for 3D structure acquisition, based on structured light. Unlike classical structured light methods, in which a static projector illuminates a scene with time-varying illumination patterns, our technique makes use of a moving projector emitting a static striped illumination pattern. This projector is translated at a constant velocity, in the direction of the projector´s horizontal axis. Illuminating the object in this manner allows us to perform a per pixel analysis, in which we decompose the recorded illumination sequence into a corresponding set of frequency components. The dominant frequency in this set can be directly converted into a corresponding depth value. This per pixel analysis allows us to preserve sharp edges in the depth image. Unlike classical structured light methods, the quality of our results is not limited by projector or camera resolution, but is solely dependent on the temporal sampling density of the captured image sequence. Additional benefits include a significant robustness against common problems encountered with structured light methods, such as occlusions, specular reflections, subsurface scattering, interreflections, and to a certain extent projector defocus.
Keywords :
cameras; image sequences; 3D structure acquisition; camera resolution; captured image sequence; classical structured light method; constant velocity; dominant frequency; extent projector defocus; pixel analysis; recorded illumination sequence; sliding projection; specular reflection; static projector illumination; static striped illumination pattern; subsurface scattering; temporal sampling density; time-varying illumination pattern; Cameras; Frequency conversion; Image analysis; Image converters; Image resolution; Image sequence analysis; Layout; Lighting; Performance analysis; Pixel;
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-3992-8
DOI :
10.1109/CVPR.2009.5206610