• DocumentCode
    3003652
  • Title

    Condition diagnosis with complex network-time series analysis

  • Author

    Pan, Jiacheng ; Jiang, Hongquan ; Gao, Jianmin ; Yang, Peilin

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we have introduced a novel method for condition diagnosis of complex systems in the chemical process industry with complex network based time series analysis. Firstly, by a computational method, the condition data from the complex system can be mapped into a network, which inherits the properties of condition data. Then, the topological properties of these complex networks are investigated, and the topological properties can be the features of condition. Finally, Dempster-Shafer (DS) evidence theory is applied to combining multiple features to find the underlying condition. A remarkable case study is provided to illustrate the method and to test its effectiveness. Results show that different condition data of system exhibit distinct and different topological properties; and the proposed methods can detect potential abnormal conditions from the normal condition effectively. This approach is markedly different from conventional methods, and can overcome the disadvantages in application of data-driven methods to condition diagnosis of complex system.
  • Keywords
    chemical industry; time series; uncertainty handling; Dempster-Shafer evidence theory; chemical process industry; condition diagnosis; network-time series analysis; topological properties; Complex networks; Condition monitoring; Feature extraction; Finite element methods; Industries; Noise measurement; Time series analysis; Condition Diagnosis; complex network; time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754502
  • Filename
    5754502