• DocumentCode
    3003926
  • Title

    Materiel availability modeling and analysis for a complex Army weapon system

  • Author

    Anderson, Dennis J. ; Hoffman, Matthew J. ; Martin, Jeffrey A. ; Gunther, David W.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2011
  • fDate
    24-27 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Materiel availability (Am) is a new US Department of Defense Key Performance Parameter (KPP) implemented through a mandatory Sustainment Metric consisting of an Availability KPP and two supporting Key System Attributes (KSAs), materiel reliability and ownership cost. Sandia National Laboratories (Sandia), in conjunction with several US Army organizations, developed the analytical foundation, assumptions, and brigade-level modeling approach to support lifecycle, fleet-wide Am modeling and analysis of a complex Army weapon system. Like operational availability (Ao), Am is dependent on reliability, but Am is also affected by other factors that do not impact Ao. The largest influences on Am are technology insertion and reset downtimes. Am is a different metric from Ao. Whereas Ao is an operational measure, Am is more of a programmatic measure that spans a much larger timeframe, additional sources of downtime, and add itional sources of unscheduled maintenance.
  • Keywords
    military computing; military equipment; reliability; weapons; US Department of Defense; brigade-level modeling approach; complex army weapon system; fleet-wide Am modeling; key performance parameter; key system attributes; mandatory sustainment metric; materiel availability analysis; materiel availability modeling; materiel reliability; operational availability; Analytical models; Availability; Maintenance engineering; Measurement; Training; Weapons; materiel availability; modeling and simulation; operational availability; reliability; repairable systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2011 Proceedings - Annual
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-8857-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2011.5754517
  • Filename
    5754517