DocumentCode
3004893
Title
Multi-port scattering matrix measurement using a reduced-port network analyzer
Author
Hsin-Chia Lu ; Tah-Hsiung Chu
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
4
fYear
1999
fDate
13-19 June 1999
Firstpage
1877
Abstract
A novel method to acquire the scattering matrix of an n-port network from the measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three-port or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results of a four-port microstrip circuit show the good accuracy using the developed method.
Keywords
S-matrix theory; S-parameters; circuit testing; microstrip circuits; microwave measurement; network analysis; two-port networks; 2 to 10 GHz; four-port microstrip circuit; multi-port scattering matrix measurement; n-port network; nonreciprocal n-port network; reciprocal n-port network; reduced-port network analyzer; three-port network analyzer; two-port network analyzer; Circuits; Councils; Degradation; Electric variables measurement; Joining processes; Microstrip; Performance evaluation; Polynomials; Scattering parameters; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.780339
Filename
780339
Link To Document