• DocumentCode
    3004893
  • Title

    Multi-port scattering matrix measurement using a reduced-port network analyzer

  • Author

    Hsin-Chia Lu ; Tah-Hsiung Chu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    4
  • fYear
    1999
  • fDate
    13-19 June 1999
  • Firstpage
    1877
  • Abstract
    A novel method to acquire the scattering matrix of an n-port network from the measurements using a reduced-port network analyzer is developed. This method can obtain the scattering matrix of a nonreciprocal or reciprocal n-port network with the use of a three-port or two-port network analyzer. The formulation of this method considers the imperfection of terminators used in the measurement, and only two of the terminators are required to be known. Experimental results of a four-port microstrip circuit show the good accuracy using the developed method.
  • Keywords
    S-matrix theory; S-parameters; circuit testing; microstrip circuits; microwave measurement; network analysis; two-port networks; 2 to 10 GHz; four-port microstrip circuit; multi-port scattering matrix measurement; n-port network; nonreciprocal n-port network; reciprocal n-port network; reduced-port network analyzer; three-port network analyzer; two-port network analyzer; Circuits; Councils; Degradation; Electric variables measurement; Joining processes; Microstrip; Performance evaluation; Polynomials; Scattering parameters; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1999 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5135-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1999.780339
  • Filename
    780339