DocumentCode
3004949
Title
Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method
Author
Kobayashi, Y. ; Shimizu, T.
Author_Institution
Dept. of Electr. & Electron. Eng., Saitama Univ., Urawa, Japan
Volume
4
fYear
1999
fDate
13-19 June 1999
Firstpage
1885
Abstract
A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.
Keywords
III-V semiconductors; cavity resonators; dielectric bodies; gallium arsenide; millimetre wave measurement; mode matching; permittivity measurement; 30 to 100 GHz; GaAs; GaAs substrates; MM waves; circular cavity resonance method; complex permittivity; low loss dielectric plates; millimeter wave measurements; mode matching technique; rigorous analysis; temperature dependence; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Resonance; Temperature dependence; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.780341
Filename
780341
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