• DocumentCode
    300592
  • Title

    Statistical projection methods and artificial neural networks

  • Author

    Conlin, A.K. ; Zhang, J. ; Martin, E.B. ; Morris, A.J.

  • Author_Institution
    Dept. of Chem. & Process Eng., Newcastle upon Tyne Univ., UK
  • Volume
    3
  • fYear
    1995
  • fDate
    21-23 Jun 1995
  • Firstpage
    1852
  • Abstract
    There is an increasing strategic interest in the use of NIR to monitor and control material properties. The aim being to tightly control quality variables and reduce product variability. Given the number of academic publications in NIR spectroscopy the question arises as to why has industry been so slow in taking it up. The interpretation of spectral data is usually achieved using the linear projection techniques of principal components regression and projection to latent structures. However, nonlinear responses, which can be attributed to a whole range of sources, including physical, chemical, sensor and instrument, as well as asymmetric noise effects, etc., are evident in many chemical processes. Multivariate methods capable of detecting and modelling nonlinear features have received increasing attention, e.g. multivariate adaptive regression splines and neural networks. A study is carried out on industrial spectral measurements to assess the ability of these analysis methods as inferential estimators of material properties for process control
  • Keywords
    calibration; chemical industry; infrared spectroscopy; monitoring; neural nets; process control; statistical analysis; asymmetric noise effects; chemical processes; industrial spectral measurements; inferential estimators; latent structure projection; linear projection; near infrared spectroscopy; neural networks; principal components regression; process control; spectral data; statistical projection methods; Artificial neural networks; Chemical processes; Chemical sensors; Industrial control; Instruments; Material properties; Monitoring; Neural networks; Sensor phenomena and characterization; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, Proceedings of the 1995
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2445-5
  • Type

    conf

  • DOI
    10.1109/ACC.1995.531207
  • Filename
    531207