• DocumentCode
    3006007
  • Title

    On randomly interleaved memories

  • Author

    Raghavan, Ram ; Hayes, John P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1990
  • fDate
    12-16 Nov 1990
  • Firstpage
    49
  • Lastpage
    58
  • Abstract
    The authors analyze and identify a basic deficiency of a class of random interleaving schemes (LINEAR), which use linear transformation techniques to achieve randomization. Since all bank addresses generated by these methods are random, constrained only by the bijective property, more conflicts tend to occur than in the more common MODULO method. Also LINEAR lacks the capability of MODULO to move several conflicting vector streams to a conflict-free steady state. To correct these deficiencies, a new class of random interleaving schemes called RANDOM-H that hash only the higher-order address bits is proposed. Unlike LINEAR, the RANDOM-H schemes randomize selectively, while retaining some of the advantages of MODULO. It is shown that RANDOM-H has a higher probability of accessing a vector without conflict than LINEAR. An an example of RANDOM-H, a method called MASH is presented that combines module interleaving with a multiplicative hashing function for randomization
  • Keywords
    concurrency control; memory architecture; parallel architectures; storage allocation; storage management; MASH; RANDOM-H; bank addresses; bijective property; conflict-free steady state; conflicting vector streams; linear transformation; memory address interleaving; memory contention; module interleaving; multiplicative hashing function; random interleaving schemes; randomization; randomly interleaved memories; vector processors; Bandwidth; Computer architecture; Delay; Hardware; Interleaved codes; Laboratories; Multi-stage noise shaping; Performance analysis; Random access memory; Vector processors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Supercomputing '90., Proceedings of
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-8186-2056-0
  • Type

    conf

  • DOI
    10.1109/SUPERC.1990.130001
  • Filename
    130001