• DocumentCode
    3006180
  • Title

    Compatibility of lead-free solders with lead containing surface finishes as a reliability issue in electronic assemblies

  • Author

    Vianco, Paul ; Rejent, Jerry ; Artaki, Iris ; Ray, Urmi ; Finley, Donald ; Jackson, Anna

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    1172
  • Lastpage
    1183
  • Abstract
    Enhanced performance goals and environmental restrictions have heightened the consideration for use of alternative solders as replacements for the traditional tin-lead (Sn-Pb) eutectic and near-eutectic alloys. However, the implementation of non-Pb bearing surface finishes may lag behind solder alloy development. A study was performed which examined the effect(s) of Pb contamination on the performance of Sn-Ag-Bi and Sn-Ag-Cu-Sb lead-free solders by the controlled addition of 63Sn-37Pb solder at levels of 0.5-8.0 Wt.%. Thermal analysis and ring-in-plug shear strength studies were conducted on bulk solder properties. Circuit board prototype studies centered on the performance of 20I/O SOIC gull wing joints. Both alloys exhibited declines in their melting temperatures with greater Sn-Pb additions. The ringing-plug shear strength of the Sn-Ag-Cu-Sb solder increased slightly with Sn-Pb levels while the Sn-Ag-Bi alloy experienced a strength loss. The mechanical behavior of the SOIC Sn-Ag-Bi solder joints reproduced the strength drop to Sn-Pb contamination; however, the strength levels were insensitive to 10,106 thermal cycles. The Sn-Ag-Cu-Sb solder showed a slight decrease in the gull wing joint strengths that was sensitive to the Pb content of the surface finish
  • Keywords
    environmental factors; shear strength; silver alloys; soldering; thermal analysis; tin alloys; 20I/O SOIC gull wing joint; Sn-Ag-Bi; Sn-Ag-Cu-Sb; circuit board; electronic assembly; environmental restrictions; lead containing surface finish; lead contamination; lead-free solder; mechanical properties; melting temperature; reliability; ring-in-plug shear strength; thermal analysis; thermal cycling; Assembly; Contamination; Electronic packaging thermal management; Electronics packaging; Environmentally friendly manufacturing techniques; Lead; Printed circuits; Prototypes; Surface finishing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.550885
  • Filename
    550885