DocumentCode
3006226
Title
Silicon Emitter Failure Initiation
Author
Bintz, WJ ; McGruer, N.E.
Author_Institution
Northeastern University
fYear
1993
fDate
12-15 Jul 1993
Firstpage
108
Lastpage
109
Keywords
Application software; Circuit testing; Computer displays; Current measurement; Electrons; Microelectronics; Silicon; Surface contamination; Vacuum arcs; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN
0-7803-0852-2
Type
conf
DOI
10.1109/IVMC.1993.700303
Filename
700303
Link To Document