Substrate noise reduction using active guard band filters in mixed-signal integrated circuits

Author

Makie-Fukuda, Keiko ; Maeda, Satoshi ; Tsukada, Toshiro ; Matsuura, Tatsuji

Author_Institution

Central Res. Lab., Hitachi Ltd., Tokyo, Japan

fYear

1995

fDate

8-10 June 1995

Firstpage

33

Lastpage

34

Abstract

A substrate noise reduction technique using an "active guard band filter", is developed for analog and digital mixed-signal integrated circuits. A noise cancellation signal generated by operational amplifiers is actively input into a guard band to cancel substrate noise. In a 0.8 /spl mu/m CMOS test chip, substrate noise was experimentally suppressed to less than 1% of the original non-canceled noise for frequencies below 1 MHz by using this technique.

Keywords

CMOS integrated circuits; active filters; integrated circuit noise; mixed analogue-digital integrated circuits; 0.8 micron; 1 MHz; CMOS chip; active guard band filters; mixed-signal integrated circuits; noise cancellation signal; operational amplifiers; substrate noise; Active filters; Circuit testing; Digital filters; Integrated circuit noise; Mixed analog digital integrated circuits; Noise cancellation; Noise generators; Noise reduction; Operational amplifiers; Signal generators;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on

Conference_Location

Kyoto, Japan

Print_ISBN

0-7800-2599-0

Type

conf

DOI

10.1109/VLSIC.1995.520675

Filename

520675