Title :
Isometric registration of ambiguous and partial data
Author :
Tevs, Art ; Bokeloh, Martin ; Wand, Michael ; Schilling, Andreas ; Seidel, Hans-Peter
Author_Institution :
Max-Planck Inst. Inf., Germany
Abstract :
This paper introduces a new shape matching algorithm for computing correspondences between 3D surfaces that have undergone (approximately) isometric deformations. The new approach makes two main contributions: First, the algorithm is, unlike previous work, robust to “topological noise” such as large holes or “false connections”, which is both observed frequently in real-world scanner data. Second, our algorithm samples the space of feasible solutions such that uncertainty in matching can be detected explicitly. We employ a novel randomized feature matching algorithm in order to find robust subsets of geodesics to verify isometric consistency. The paper shows shape matching results for real world and synthetic data sets that could not be handled using previous deformable matching algorithms.
Keywords :
feature extraction; image matching; image reconstruction; random processes; 3D surface; isometric registration; randomized feature matching algorithm; shape matching algorithm; Animation; Art; Calibration; Deformable models; Iterative closest point algorithm; Noise robustness; Noise shaping; Shape; Spatial resolution; Uncertainty;
Conference_Titel :
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-3992-8
DOI :
10.1109/CVPR.2009.5206775