DocumentCode
3007002
Title
Learning photometric invariance from diversified color model ensembles
Author
Alvarez, Jose M. ; Gevers, Theo ; Lopez, A.
Author_Institution
Comput. Vision Center & Comput. Sci. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
fYear
2009
fDate
20-25 June 2009
Firstpage
565
Lastpage
572
Abstract
Color is a powerful visual cue for many computer vision applications such as image segmentation and object recognition. However, most of the existing color models depend on the imaging conditions affecting negatively the performance of the task at hand. Often, a reflection model (e.g., Lambertian or dichromatic reflectance) is used to derive color invariant models. However, those reflection models might be too restricted to model real-world scenes in which different reflectance mechanisms may hold simultaneously. Therefore, in this paper, we aim to derive color invariance by learning from color models to obtain diversified color invariant ensembles. First, a photometrical orthogonal and non-redundant color model set is taken on input composed of both color variants and invariants. Then, the proposed method combines and weights these color models to arrive at a diversified color ensemble yielding a proper balance between invariance (repeatability) and discriminative power (distinctiveness). To achieve this, the fusion method uses a multi-view approach to minimize the estimation error. In this way, the method is robust to data uncertainty and produces properly diversified color invariant ensembles. Experiments are conducted on three different image datasets to validate the method. From the theoretical and experimental results, it is concluded that the method is robust against severe variations in imaging conditions. The method is not restricted to a certain reflection model or parameter tuning. Further, the method outperforms state-of- the-art detection techniques in the field of object, skin and road recognition.
Keywords
image colour analysis; learning (artificial intelligence); color invariant models; color model ensembles; image datasets; image segmentation; learning photometric invariance; object recognition; parameter tuning; reflectance mechanisms; reflection model; state-of- the-art detection techniques; Application software; Computer vision; Estimation error; Image segmentation; Layout; Object recognition; Photometry; Reflectivity; Robustness; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on
Conference_Location
Miami, FL
ISSN
1063-6919
Print_ISBN
978-1-4244-3992-8
Type
conf
DOI
10.1109/CVPR.2009.5206785
Filename
5206785
Link To Document