DocumentCode :
3007101
Title :
Controlling susceptibilities of quantum dots influenced by electromechanical effects
Author :
Prabhakar, Sanjay ; Melnik, Roderick
Author_Institution :
MS2Discovery Interdiscipl. Res. Inst., Wilfrid Laurier Univ., Waterloo, ON, Canada
fYear :
2015
fDate :
21-24 April 2015
Firstpage :
256
Lastpage :
260
Abstract :
This contribution is devoted to the study of optical properties of AlN/GaN quantum dots, focusing on their susceptibility and electromechanical effects affecting such properties. We exemplify main ideas on a model based on the two-band strain-dependent Hamiltonian in cylindrical coordinates. On the first step of our procedure, the resulting strain-dependent two-band Hamiltonian model in effective mass approximation is solved for wurtzite AlN/GaN QDs numerically. Then the wavefunctions for three lowest levels, obtained from our first step, are employed to calculate the dipole moment matrix elements. Finally, the density matrix approach is used for calculation of susceptibility. The feasibility of controlling susceptibility is studied under the influence of electromechanical effects on quantum dot optical properties. Among other things, we demonstrate that electromechanical effects induce blue shifts in the resonance peak of susceptibility in wurtzite quantum dots under the study.
Keywords :
III-V semiconductors; aluminium compounds; effective mass; electromechanical effects; gallium compounds; optical susceptibility; semiconductor quantum dots; spectral line shift; wave functions; wide band gap semiconductors; AlN-GaN; blue shifts; dipole moment matrix elements; effective mass approximation; electromechanical effects; optical properties; quantum dots; resonance peak; susceptibility; two-band strain-dependent Hamiltonian; wavefunctions; Aluminum nitride; Gallium nitride; III-V semiconductor materials; Nonlinear optics; Quantum dots; Strain; coupled models; density matrix approach; electromechanical effects; optoelectromechanical properties; quantum dots; susceptibilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2015 IEEE 35th International Conference on
Conference_Location :
Kiev
Type :
conf
DOI :
10.1109/ELNANO.2015.7146887
Filename :
7146887
Link To Document :
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