• DocumentCode
    3007301
  • Title

    Three-Level Active Neutral-Point-Clamped (ANPC) Converter with Fault Tolerant Ability

  • Author

    Li, Jun ; Huang, Alex Q. ; Bhattacharya, Subhashish ; Tan, Guojun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
  • fYear
    2009
  • fDate
    15-19 Feb. 2009
  • Firstpage
    840
  • Lastpage
    845
  • Abstract
    Compared with traditional three-level neutral-point-clamped converter, the recently proposed three-level active neutral-point-clamped (ANPC) converter can overcome the unequal loss distribution among semiconductor devices, and therefore result in increased output power or switching frequency. In industrial applications, fault tolerance of power electronics converters is very important considering system availability, safety and reliability. This paper presents the fault tolerant ability of three-level ANPC converter. Control schemes are proposed to keep the neutral-point voltage balanced and get stable and continuous output under single device fault for both open-circuit fault and short-circuit fault cases. Simulation results show the effectiveness of the fault tolerant ability of the three-level ANPC inverter under the presented control strategies, which are promising to carry on further experimental validation.
  • Keywords
    electrical safety; fault tolerance; power convertors; semiconductor devices; fault tolerant ability; open-circuit fault; power electronics converters; semiconductor devices; short-circuit fault; switching frequency; three-level ANPC inverter; three-level active neutral-point-clamped converter; unequal loss distribution; Electrical equipment industry; Electronics industry; Fault tolerance; Fault tolerant systems; Power electronics; Power generation; Power system reliability; Semiconductor devices; Switching converters; Switching frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2009. APEC 2009. Twenty-Fourth Annual IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-2811-3
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2009.4802759
  • Filename
    4802759