DocumentCode :
3007363
Title :
Simulation of mini-band formation in triple si quantum wells based resonant tunneling diode
Author :
Purwiyanti, Sri ; Nuryadi, Ratno ; Hartanto, Djoko
fYear :
2011
fDate :
21-24 Nov. 2011
Firstpage :
756
Lastpage :
759
Abstract :
In this work, we investigate the formation of mini-band energy in triple Si quantum wells-based resonance tunnelling diode focusing on the effect of applied bias on the band. The formation of mini-bands is obtained from the calculation of electron tunnelling probability through the wells. The calculation is done based on transfer matrix method. The simulation results show the mini-band formation due to the appearance of discrete energy group. The changes of applied bias, quantum well width and barrier thickness causes the change of the mini-band width. These results indicate that the device structure and applied bias condition play a key role on the formation of mini-band energy in the quantum wells.
Keywords :
elemental semiconductors; matrix algebra; probability; quantum well devices; resonant tunnelling diodes; semiconductor quantum wells; silicon; Si; applied bias condition; barrier thickness; device structure; discrete energy group; electron tunnelling probability; miniband energy; miniband formation simulation; quantum well width; resonant tunneling diode; transfer matrix method; triple-silicon quantum wells; Electric potential; Energy states; Potential energy; Probability; Resonant tunneling devices; Silicon; Superlattices; Triple quantum wells; applied bias; mini-band discrete energy; tunnelling probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2011 - 2011 IEEE Region 10 Conference
Conference_Location :
Bali
ISSN :
2159-3442
Print_ISBN :
978-1-4577-0256-3
Type :
conf
DOI :
10.1109/TENCON.2011.6129211
Filename :
6129211
Link To Document :
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