DocumentCode
3007654
Title
Plastic Packaging Consortium-first year results
Author
Nguyen, L.T. ; Giberti, R.W.
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear
1996
fDate
28-31 May 1996
Firstpage
1239
Lastpage
1243
Abstract
The Plastic Packaging Consortium is a funded Technology Reinvestment Project (TRP) awarded in the FY94 competition on low-cost electronic packaging. The ten companies $20M+ cost-shared effort, led by National Semiconductor Corp., will establish the on-shore infrastructure to manufacture low-cost, high density, high performance “ruggedized” plastic packages. This initiative comes from the increasing need to improve complexity, performance, and reliability of plastic packages for both military and commercial use, while lowering the total system cost. The Program focuses on three areas of improvement: (1) plastic package “ruggedization”; (2) plastic package thermal enhancement; and, (3) high density plastic packages. Advances in molding compounds, die attach materials, leadframe materials, leadframe design, and reliability characterization will be accomplished. The deliverables at the end of the two-year Program will be plastic package processes and materials, which require no dry-bagging, eliminate “popcorning”, improve low-cost (stamped) fine pitch leadframes, and utilize low-cost interconnect processes for high density packaging. This paper reports the results obtained in the three focus areas after the first year of activities
Keywords
fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; plastic packaging; reliability; research initiatives; Plastic Packaging Consortium; Technology Reinvestment Project; die attach materials; fine pitch leadframes; high density packaging; leadframe design; leadframe materials; low-cost electronic packaging; low-cost interconnect processes; molding compounds; package thermal enhancement; popcorning elimination; reliability characterization; ruggedized plastic packages; Electromagnetic compatibility; Electronic components; Heat sinks; Lead; Materials testing; Mechanical factors; Microassembly; Plastic packaging; Resins; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-3286-5
Type
conf
DOI
10.1109/ECTC.1996.550893
Filename
550893
Link To Document