DocumentCode
3007975
Title
Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra-low noise
Author
Dick, John ; Saunders, Jon
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
1989
fDate
31 May-2 Jun 1989
Firstpage
107
Lastpage
114
Abstract
Phase noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering-gallery mode sapphire ring resonator with Q of 2×105. Isolation of RF fields by the special nature of the electromagnetic mode allows the very low loss of the sapphire itself to be realized. Several mode families have been identified with fairly good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n =5 to n =10 full waves around the perimeter. Based on the measurements and on the performance of commercially available phase detectors, the performance for a cooled resonator operating at 77 K with a Q of 3×107 is projected to be -85 dB/Hz at an offset of 1 Hz. This value is 30 dB below that of the best X -band source presently available, a frequency-multiplied quartz crystal oscillator
Keywords
dielectric resonators; frequency stability; microwave oscillators; sapphire; 77 K; cooled resonator; electromagnetic mode; microwave oscillator; phase noise measurements; sapphire dielectric ring resonator; ultra-low noise; waveguide coupling parameters; whispering-gallery mode; Electromagnetic measurements; Frequency measurement; Microwave measurements; Microwave oscillators; Noise measurement; Phase measurement; Phase noise; Q measurement; Ring oscillators; Whispering gallery modes;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/FREQ.1989.68843
Filename
68843
Link To Document